Failure Analysis Equipment helps in Determining the root cause of Failure and gives Best Solutions

Failure analysis is an engineering approach to determining how and why component or equipment has failed. The goal of a failure analysis is to understand the root cause of the failure to prevent similar failures in the future. Common causes of failure include misuse or abuse, manufacturing defects, assembly errors, improper maintenance, design errors, improper material, fastener failure, improper heat treatments, inadequate quality assurance, inadequate environmental protection/control, unforeseen operating conditions and casting discontinuities

 

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Global Failure Analysis Equipment Market was valued at US$4.1 bn in 2012. The market is expected to rise at a CAGR of 8.8% between 2013 and 2019. Rapid progression in nanotechnology, combined with the development of the medical sector in Asia Pacific, are the foremost reasons driving growth of the failure analysis equipment market. Furthermore, increased investments for upgradation of research and education infrastructure are also benefitting the market’s growth. However, the high cost of failure analysis equipment is limiting its adoption, predominantly in emerging nations. Nevertheless, the development of innovative techniques such as correlative light and electron microscopy (CLEM) and super-resolution microscopy for biological studies will bolster the market’s growth in the years to come. 

 

Failure analysis equipment is used to determine anomalies in the functioning of various processes and systems across manufacturing, biotechnology, service, and other industries. The equipment is used to detect the reasons of breakdowns or errors at a preliminary stage, which can help accrue considerable savings over time.

 

Failure analysis equipment Market: By equipment 

 

> Scanning electron microscope (SEM)

> Transmission electron microscope (TEM)

> Focused Ion Beam system (FIB)

> Dual – Beam (FIB/SEM) systems 

 

In 2012, transmission electron microscopes (TEM) and focused ion beam systems held the majority share in the market due to their widespread utilization. Nevertheless, FIB/SEM systems are expected to register the fastest growth until the end of the forecast period. This is because FIB/SEM systems exhibit several advantages over single-beam FIB systems for sample composition and microscopy applications.

 

Failure analysis equipment Market: By technology 

 

> Focused ion beam (FIB)

> Broad ion milling (BIM)

> Secondary ion mass spectroscopy (SIMS)

> Energy dispersive X-ray spectroscopy (EDX)

> Reactive ion etching (RIE)

> Chemical mechanical planarization (CMP)

 

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In 2012, SIMS held the majority share in the market due to its ability to identify elements present in low concentrations and to detect elements such as hydrogen and helium that other technologies are not capable of detecting. 

 

In 2012, Asia Pacific contributed the largest revenue to the failure analysis equipment market. This is because several countries in this region, such as China, Japan, Australia, India, and Taiwan, are investing heavily in research and development infrastructure, medical technologies, and nanotechnology. In the same year, North America and Europe collectively held a share of more than one-third in the market, since failure analysis equipment has been used in these regions for R&D purposes for a long time. 

 

The top players in the failure analysis equipment market are FEI Company, Carl Zeiss SMT GmbH, Hitachi High-technologies Europe GmbH, and JEOL Ltd. among others.

 

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